8D报告模板8D_report_example

CUSTOMER COMPLAINT - FINAL REPORT CUSTOMER COMPLAINT - FINAL REPORT 8D Report number: F040358000FQS -8D GLOBAL INFORMATION 8D Close Date: February 04, 2004 CUSTOMER NAME: ARRAY ELECTRONICS LTD. Customer contact: Tony Chen Customer ref.: Customer part number: Area ref. number: NA401012 ST creator: Mr Gary HUA, Field Quality Service Asia Pacific ST manager: (8D report creator) Mr. Bt LEE, Muar plant Quality & Reliability St ref.: F040358000FQS ST commercial product: TDA2007A ST Distribution list: Mr Blancky HO, Field Quality Service Asia Pacific Mrs Cathy LI, Field Quality Service Asia Pacific EDDY GAN, PDIP TEST Mr Gary HUA, Field Quality Service Asia Pacific SP LOW, QA / FA Mr Austin WU, Field Quality Service Asia Pacific Report approved by: Title: Date: Signature: BT LEE CHIEF FA ENGINEER 04 Feb 04 Report prepared by: SP LOW FA ENGINEER 04 Feb 04 Customer name Customer ref. Customer Prod. No ST Complaint Ref. ST Commer. product ARRAY ELECTRONICS LTD. F040358000FQS TDA2007A Detail information Complaint information Customer date: January 19, 2004 ST creation date: January 19, 2004 ST evidence received date (by FAR Mgr.): January 26, 2004 Quantity received by ST: 12 Quantity affected at Customer: Customer failure rate (ppm): Origin of the defect: Manufacturing Customer symptom description: The end cusomer believes this part has potential risk. Customer contact: Tony Chen ST complaint creator Mr Gary HUA, Field Quality Service Asia Pacific ST complaint manager: (8d report creator) Mr. Bt LEE, Muar plant Quality & Reliability Device information Customer part # : ST commercial product : TDA2007A ST raw line #: BA7A*L443CAX Product family (code & description): 70 AUDIO SYSTEMS Package: 7A SIL 9 Wafer fab. process: OF MT/-H Wafer fab.: 0857 AMKF AMK 5''; CFM Assembly fab.: 0959 MU1A ST MUAR - MALAYSIA Test plant: 0959 MU1T ST MUAR - MALAYSIA 8D RESULTS SYNOPSIS / PROBLEM DESCRIPTION Dominant defect description : 1: EOS, ESD 2: EOS - ESD 3: EOS - ESD general Sample Ref Qty QA number Tracecode 1 9 W99CE0341 2 3 W99CD0341 Root Cause: Application / Electrical overstress Containment action: Implementation date : None. February 04, 2004 Corrective action: Implementation date : Not Applicable February 04, 2004 8D REPORT DETAILS: F040358000FQS -8D ST Analysis results synopsis Dominant defect description : 1: EOS, ESD 2: EOS - ESD 3: EOS - ESD general Sample Ref Qty QA number Tracecode 1 9 W99CE0341 2 3 W99CD0341 1D – Team 8D team leader : Mr. Bt LEE, Muar plant Quality & Reliability Team members : EDDY GAN, PDIP TEST SP LOW, QA / FA 2D – Problem description Customer symptom Sample: 1 Cust. symptom description: the end cusomer believes this part has potential risk. Sample: 2 Cust. symptom description: the end cusomer believes this part has potential risk. Symptom comments 11 units were tested failed catastropy. Burnt marks due to electrical overstress were observed. 1 unit was tested good in ATE. Muar FA Findings: Steps Findings External visual inspection Only 3 units with tracecodeW99CE0341 have unbroken leads, the other 9 units were having broken leads. Curve tracing Leakage or short at Pin 8 or Pin 9 vs ground except for unit with reference #1. X-rays No anomalies. ATE Only unit with reference #1 was tested good in ATE, the other 11 units were tested fail – Bin #6, #27 and #28. Decapsulation - Internal visual inspection Burnt marks were observed on die top between Pin 8 and Pin 9 rails for units with reference #4, #5, #10 and #11. Note: Units with reference #1 to #9 are from tracecode W99CE0341; units with reference #10 to #12 are from tracecode W99CD0341. Enclosure: 3D – Containment action Not Applicable. 4D – Cause Area involved Macro process: CUSTOMER Location: CUSTOMER Process step: APPLICATION (EOS) Root cause Root cause: Application / Electrical overstress Defect intentionally reproduced: Escape root cause description: Not Applicable. Problem root cause description: Not Applicable. 5D – Corrective action & Verification Not Applicable. 6D – Implementation of permanent corrective action Not Applicable. 7D – Prevention Revised Quality System Doc. Reference & version changes Date of create-update Error of process: NO Control plan Ref.: Not applicable Error of application: YES Failure Modes Effects Analysis Ref.: Not applicable Specification Ref.: Not applicable Cross-fertilization Ref.: Not applicable Text - Comments : Not required since the unit was failed during the customer's application. 8D – Information & Conclusion Status: Completed Close date: February 04, 2004 Estimated date of parts delivery after containment Additional comments: None. Electrical Analysis ANALYSIS DATA AND RESULTS : Sample ref.: F040358000FQS -EA1 - 2 Units ser. no: All units Fail type: Stable Correlation with customer: no Electrical defect: 1- TESTING 2- DC tests 3- Short. Remark: All units were tested failed catastropy in ATE. Sample ref.: F040358000FQS -EA1 - 1 Units ser. no: All units Fail type: Stable Correlation with customer: no Electrical defect: 1- TESTING 2- DC tests 3- Short. Remark: Unit with reference #1 was tested good in ATE while the other 8 were tested failed catastropy. Text – Final comments: 11 units were tested failed catastropy. 1 unit with tracecode W99CE0341 was tested good and will be sent back to FQS. Analysis performed by: EDDY GAN Area /Department: PDIP TEST Datalog for Good Unit: