Corning HPFS Fused Silica
Semiconductor
Optics
HPFS® Fused Silica ArF Grade
HPFS® ArF Grade, Corning code 7980, is a high purity synthetic amorphous silicon dioxide manufactured by
flame hydrolysis. The noncrystalline, colorless, silica glass combines a very low thermal expansion...
Semiconductor
Optics
HPFS® Fused Silica ArF Grade
HPFS® ArF Grade, Corning code 7980, is a high purity synthetic amorphous silicon dioxide manufactured by
flame hydrolysis. The noncrystalline, colorless, silica glass combines a very low thermal expansion coefficient
with excellent optical qualities and exceptional transmittance in the deep ultraviolet. ArF Grade was developed
for 193 nm lithography systems.
In order to satisfy the challenging quality requirements of our customers in leading edge applications such as
microlithography, Corning is dedicated to continuous improvement. Our investments in research and develop-
ment, combined with Corning’s quality systems, support our technology leadership position and ensure that we
meet our customer’s requirements on time, every time.
NOTES:
1. Defines the sum of the cross section in mm2 of inclusions per 100 cm3 of glass. Inclusions with a
diameter ≤ 0.10 mm are disregarded.
2. Refers to the diameter of the largest single inclusion.
3. Index homogeneity: the maximum index variation (relative), measured over the clear aperture of the blank.
4. Index homogeneity is certified using an interferometer at 632.8 nm. The numerical homogeneity is reported as the average
through the piece thickness. Blanks with diameter up to 450 mm can be analyzed over the full aperture. Larger parts can
be analyzed using multiple overlapping apertures. The minimum thickness for index homogeneity verification is 20 mm.
For thinner parts, the parent piece is certified.
Quality Grade Selection Chart—HPFS® ArF Grade
Corning defines and certifies the quality of HPFS® glass using two criteria: inclusions and homogeneity grade.
Inclusion Class Homogeneity 3,4 ppm
Grade
Total inclusion1 Maximum2 AA A C F
Class cross section [mm2] size [mm] ≤ 0.5 ≤ 1 ≤ 2 ≤ 5
0 ≤ 0.03 0.10 ■ ■ ■ ■
1 ≤ 0.10 0.28 ■ ■ ■
2 ≤ 0.25 0.50 ■ ■
Chemical durability and Impurities
Solution Time Weight Loss Impurities
[mg/cm2]
5% HCL by weight @95 ºC 24 h < 0.010 OH content (by weight): 800 – 1000 ppm
5% NaOH @95 ºC 6 h 0.453 Impurities other than OH: <100 ppb
0.02N NA2CO3 @95 ºC 6 h 0.065
0.02N H2SO4 @95 ºC 24 h < 0.010
Deionized H2O @95 ºC 24 h 0.015
10% HF by weight @25 ºC 20 m 0.230
10% NH4F*HF by weight @25 ºC 20 m 0.220
Softening Point 1585 ºC (107.6 poises)
Annealing Point 1042 ºC (1013 poises)
Strain Point 893 ºC (1014.5 poises)
Thermal Conductivity 1.30 W/m K
Thermal Diffusivity 0.0075 cm2/s
Average C.T.E. 0.52 ppm/K 5 ºC-35 ºC
0.57 ppm/K 0 ºC-200 ºC
0.48 ppm/K -100 ºC-200 ºC
Mechanical & Thermal Properties
Unless otherwise stated, all values @25 ºC
Elastic (Young’s) Modulus 72.7 GPa
Shear Modulus 31.4 GPa
Average Modulus of Rupture, abraded 52.4 MPa
Bulk Modulus 35.4 GPa
Poisson’s Ratio 0.16
Density 2.201 g/cm3
Knoop Hardness (100 g load) 522 kg/mm2
HPFS® ArF Grade is certified to meet
Ti ≥ 99.5%/cm@193nm.Higher transmittance
is available upon request. A typical internal
transmittance curve for HPFS® ArF Grade fused
silica is shown here.
100.00
99.90
99.80
99.70
99.60
99.50
T
i[
%
/c
m
]
180 200 220 240 260 280 300 320 340 360 380 400
wavelength [nm]
Internal transmittance
Refractive index and dispersion
Data in 22 ºC in 760mm Hg dry nitrogen gas
Wavelength Refractive Thermal
[air] Index *2 Coefficient
λ [nm] n ∆n/∆T*3 (ppm/K)
1128.64 1.448870 9.6
1064.00 1.449633 9.6
1060.00 1.449681 9.6
1013.98 nt 1.450245 9.6
852.11 ns 1.452469 9.7
706.52 nr 1.455149 9.9
656.27 nC 1.456370 9.9
643.85 nC´ 1.456707 10.0
632.80 nHe-Ne 1.457021 10.0
589.29 nD 1.458406 10.1
587.56 nd 1.458467 10.1
546.07 ne 1.460082 10.2
486.13 nF 1.463132 10.4
479.99 nF´ 1.463509 10.4
435.83 ng 1.466701 10.6
404.66 nh 1.469628 10.8
365.01 ni 1.474555 11.2
334.15 1.479785 11.6
312.57 1.484514 12.0
308.00 1.485663 12.1
248.30 1.508433 14.2
248.00 1.508601 14.2
214.44 1.533789 17.0
206.20 1.542741 18.1
194.17 1.559012 20.4
193.40 1.560208 20.5
193.00 1.560841 20.6
184.89 1.575131 22.7
Polynomial Dispersion Equation Constants *1
A0 2.104025406
A1 -1.456000330 x 10-4
A2 -9.049135390 x 10-3
A3 8.801830992 x 10-3
A4 8.435237228 x 10-5
A5 1.681656789 x 10-6
A6 -1.675425449 x 10-8
A7 8.326602461 x 10-10
Sellmeier Dispersion Equation Constants *2
B1 0.68374049400
B2 0.42032361300
B3 0.58502748000
C1 0.00460352869
C2 0.01339688560
C3 64.49327320000
∆n/∆T Dispersion Equation Constants *3
C0 9.390590
C1 0.235290
C2 -1.318560 x 10-3
C3 3.028870 x 10-4
Other Optical Properties
νd 67.79
νe 67.64
nF -nC 0.006763
nF´-nC´ 0.006802
Stress Coefficient 35.0 nm/cm MPa
Striae ISO 10110-4 Class 5/Thickness Direction
Birefringence ≤ 1nm/cm, lower specifications available
*1 Polynomial Equation: n2 = A0 + A1 λ4 + A2 λ2 + A3 λ-2 + A4 λ-4 +A5 λ-6 + A6 λ -8 + A7 λ-10 with λ in µm
*2 Sellmeier Equation: n2-1 = B1 λ2/(λ2-C1) + B2 λ2/(λ2-C2) + B3 λ2/(λ2-C3) with λ in µm
*3 ∆n/∆T Equation (20–25ºC) = C0 + C1 λ-2 + C2 λ-4 + C3 λ-6 with λ in µm
Resistance to laser damage
Samples of HPFS® ArF Grade are regularly tested at Corning’s Metrology Laboratory, Sullivan Park Research Center, to maintain
the high standards to which Corning is committed.
Corning Incorporated One Riverfront Plaza
Corning, NY 14831
607 974 9000
© Corning Incorporated 2003
HPFS® is a registered trademark
of Corning Incorporated.
www.corning.com
September 30, 2003
We are here to help you specify the best product for your application. For further information,
please contact:
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Corning Incorporated
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t: 607-974-9000
The information contained herein
is based upon data considered
to be accurate. However, no
warranty is expressed or implied
regarding the performance of this
product. The only applicable
warranties are those that are set
out in a contract or purchase.
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