1
v
ᱎ㛑 6' वᠽሩষᅮН㾘㣗˄ᓎ䆂〓˅�
�
�
�
Q/CUP
Ё 䫊 㘨 㙵 ӑ ᳝ 䰤 ݀ ৌ ӕ Ϯ ᷛ ޚ
Q/CUP hhh—2009
Ё䫊㘨㙵ӑ᳝䰤݀ৌ�থᏗ�
Q/CUP hhh—2009
I
Ⳃ�����
ࠡ 㿔 ������������������������������������������������������������������������������ �
1 㣗ೈ �������������������������������������������������������������������������������� �
2 㾘㣗ᗻᓩ⫼᭛ӊ ���������������������������������������������������������������������� �
3 ヺো㓽⬹䇁 ������������������������������������������������������������������������ �
4 ⹀ӊ �������������������������������������������������������������������������������� �
খ㗗᭛⤂ ������������������������������������������������������������������������������ �
1
ࠡ����㿔�
ᴀᷛޚ䗖⫼ѢЁ䫊㘨ϝҷ⿏ࡼᬃҬ⦄എᬃҬ⍝ঞⱘᴎᬃҬ㒜ッˈᅮНњᬃᣕ6:3ण䆂ⱘ6'व
㾺⚍ᠽሩষᷛޚǃ6'ववᑻⱘ⬉⇨⡍ᗻঞ⠽⧚ষDŽ�
ᴀᷛޚ⬅Ё䫊㘨㙵ӑ᳝䰤݀ৌᦤߎDŽ� �
ᴀᷛޚ⬅Ё䫊㘨㙵ӑ᳝䰤݀ৌᡔᴃㅵ⧚䚼㒘㒛ࠊᅮDŽ�
ᴀᷛޚЏ㽕䍋㤝ऩԡ˖Ё䫊㘨㙵ӑ᳝䰤݀ৌ⬉ᄤᬃҬⷨお䰶DŽ�
ᴀᷛޚЏ㽕䍋㤝Ҏ˖��
�
2
ᱎ㛑 6' वᠽሩষᅮН㾘㣗�
�� 㣗ೈ�
ᴀᷛޚ䗖⫼ѢЁ䫊㘨ϝҷ⿏ࡼᬃҬ⦄എᬃҬ⍝ঞⱘᴎᬃҬ㒜ッˈᅮНњᬃᣕ6:3ण䆂ⱘ6'व
㾺⚍ᠽሩষᷛޚǃ6'ववᑻⱘ⬉⇨⡍ᗻঞ⠽⧚ষDŽ�
ᴀ㾘㣗ⱘՓ⫼ᇍ䈵Џ㽕ᰃϢЁ䫊㘨ϝҷ⿏ࡼᬃҬᑨ⫼Ⳍ݇ⱘᴎᬃҬ㒜ッǃ6'वⱘᓔথǃẔ⌟ǃ
থ㸠ǃফ⧚ҹঞᑨ⫼㋏㒳ⱘⷨࠊǃᓔথǃ䲚៤㓈ᡸㄝ䚼䮼˄ऩԡ˅DŽ�
�� 㾘㣗ᗻᓩ⫼᭛ӊ�
ϟ߫᭛ӊЁⱘᴵℒ䗮䖛ᴀᷛޚⱘᓩ⫼㗠៤ЎᴀᷛޚⱘᴵℒDŽᰃ⊼᮹ᳳⱘᓩ⫼᭛ӊˈ݊ 䱣ৢ᠔᳝ⱘ
ׂᬍऩ˄ϡࣙᣀࢬ䇃ⱘݙᆍ˅ׂ䅶⠜ഛϡ䗖⫼Ѣᴀᷛޚˈ✊㗠ˈ哧ࢅḍᴀᷛޚ䖒៤ण䆂ⱘᮍⷨお
ᰃ৺ৃՓ⫼䖭ѯ᭛ӊⱘ᳔ᮄ⠜ᴀDŽᰃϡ⊼᮹ᳳⱘᓩ⫼᭛ӊˈ᳔݊ᮄ⠜ᴀ䗖⫼ѢᴀᷛޚDŽ�
lj&830RELOH�ᱎ㛑6'वᑨ⫼ষ㾘㣗NJ�
�
�� ヺো㓽⬹䇁�
SSD ᱎ㛑 SDव
API ᑨ⫼ᑣষ⬠䴶
TFव ⿄ T-Flashवˈܼৡ˖TransFLashˈজৡ:Micro SDˈᰃϔ⾡ᵕ㒚ᇣⱘᖿ䮾ᄬټ఼
वDŽ
RF ᇘ乥ᡔᴃ˄Radio Frequency˅
NFC 䖥䎱⾏᮴㒓䗮䆃ᡔᴃ˄Near Field Communication˅
SWP ऩ㒓ण䆂˄Single Wire Protocol˅
CLF 䴲㾺ࠡッ˄Contactless Front-end˅
3
�� ⹀ӊ�
���� SSD-SWPὖ䗄
6:3ᰃᣛ6LQJOH�:LUH�3URWRFROˈेऩ㒓䗮䆃ण䆂ˈᰃ1)&ࠊ఼㢃⠛ᅝܼ㢃⠛䯈ⱘষᮍᓣ䗮
䆃ण䆂ˈЏ㽕⍝ঞ⠽⧚ሖ᭄䫒䏃ሖ�݊Ⳍ݇⡍ᗻ䇋খ㗗6:3���ᷛޚ>�@DŽ�
66'�6:3ᰃᣛѢ6:3ⱘᱎ㛑6'व 䗮ˈ䖛6:3ϔḍֵো㒓ϞѢ⬉य़䋳䕑䇗ࠊॳ⧚ᅲ⦄ܼঠᎹ䗮䆃ˈ
䖭ḋৃҹᅲ⦄ᱎ㛑6'वৠᯊᬃᣕ����6:3ϸϾষDŽ6:3�ᮍḜৠᯊ⒵䎇,62����ǃ1)&�ᆍ䞣催䗳
ষˈᑊϨᰃܼঠᎹ䗮䆃ˈৃҹᅲ⦄䕗催⊶⡍⥛DŽ�
���� ⹀ӊ㒧ᵘ
⿏ࡼᬃҬᴎⱘ⹀ӊ䚼ߚࣙᣀᬃᣕ6:3ࡳ㛑ⱘᴎ66'ᬃᣕ⬉䏃ᵘ៤DŽᴎ䚼ߚϡᴀ㾘㣗Ёᦣ䗄
ᅮНˈ䇋খ㗗6:3���ᷛޚ>�@DŽ�
⹀ӊ㒧ᵘབϟ᠔⼎˖��
��㒧ᵘ⼎ᛣ�
���� SSD㾺⚍
������ ὖ䗄
66'व⠛Ϟ᳝��Ͼ㾺⚍ˈ݊Ё���ϸϾ㾺⚍ЎᠽሩষDŽԧ⼎ᛣབϟ᠔⼎˖�
��66' 㾺⚍⼎ᛣ
4
Ϟ䗄↣Ͼ㓪োⱘ㾺⚍ᑨᣝ✻㸼�Ёⱘ㾘ᅮߚ䜡DŽՓ⫼ⱘ㾺⚍ऎඳϡᑨᇐ⬉ˈᑊϨᑨ䆹Ϣ݊ᅗ㾺⚍
ऎඳ⬉䱨⾏ˈҹ䙓ܡᦦܹܹ䆒ᯊৃ㛑থ⫳ⱘⷁ䏃䯂乬DŽ�
㸼��66'�6:3व㾺⚍䇈ᯢ�
3LQ�� ৡ⿄� ㉏ൟ� ᦣ䗄�
�� '$7�� ,�2�33� ᭄㒓>%LW��@�
�� &'�'$7�� ,�2�33� व⠛պ⌟�᭄㒓>%LW�
�@�
�� &0'� 33� ᣛҸ�ડᑨ�
�� 9&&� 6� կ⬉⬉य़�
�� &/.� ,� ᯊ䩳�
�� 966� 6� ഄկ⬉⬉य़�
�� '$7�� ,�2�33� ᭄㒓>%LW��@�
�� '$7�� ,�2�33� ᭄㒓>%LW��@�
�� 6:3� � 6:3,2�
��� 9&&6:3� � կ⬉⬉य़�
������ ሎᇌ
�
66'वᷛޚ㾺⚍ⱘሎᇌঞव⠛ᭈԧⱘᴎẄ⡍ᗻᦣ䗄ሎᇌ㾘Ḑ䇋খ㗗Ⳍ݇ᷛޚ>�@ˈ݊ Ё�ᥦᠽሩ㾺
⚍�ǃ��ⱘᴎẄ⡍ᗻᦣ䗄བ�᠔⼎ˈ݊ᇍᑨⱘሎᇌ㾘Ḑབ㸼�᠔⼎˖�
�
��ᴎẄ⡍ᗻᦣ䗄˖�ᥦ㾺⚍�
�
�
5
�
�
�
㸼��ሎᇌ㾘Ḑ�
� 䗮⫼ሎᇌ� �
ᷛো� ᳔ᇣؐ� ᑇഛؐ� ᳔ؐ� ⊼ᛣ⚍�
$��� ����� ����� ����� �
$��� ����� ����� ����� �
$��� ����� ����� ����� �
$��� ����� ����� ����� �
%��� ����� ����� ����� �
%��� ����� ����� ����� �
%��� ����� �� �� �
%��� �� �� ����� �
�
���� वᑻ
������ ὖ䗄
��3LQⱘ7)वᑻᬃᣕᠽሩⱘ66'वˈгᬃᣕᷛޚ7)व⠛DŽ66'ᦦܹᯊˈᇚ䗮䖛ᠽሩⱘ�Ͼ6:3㾺⚍Ϣ
ᴎϞⱘ&/)ᓎゟ⬉⇨㘨DŽ�
������ ሎᇌ
ᐌ⫼䗖䜡वᑻⱘ㾘Ḑሎᇌབϟ᠔⼎˖�
6
7
��वᑻሎᇌ⼎ᛣ
������ ⬉⇨⡍ᗻ
वᑻⱘ㾺⬉䰏ϡᕫѢ䳊ྚDŽ�
������ ݊Ҫ⡍ᗻ
वᑻⱘᦦᢨᇓੑϡᇥѢ�����DŽ�
���� SSDवᴎⳌ݇⬉⇨⡍ᗻ
������ SSDवӥᓣϟⱘ⬉⌕
Ўњ⹂ֱ66'वৃҹҢӥᓣϟ㹿䝦ˈ66'वӥᯊⱘ⬉⌕ᑨᇣѢ���ᖂᅝDŽ�
66'वⱘ݊ᅗ⬉⇨⡍ᗻᦣ䗄䇋খ㗗Ⳍ݇ᷛޚ>�@�
8
�
������ ᴎᇍ SSDवⱘ⬉⑤կᑨ
ᔧ66'व䖯㸠ᯊ䯈䕗䭓ⱘѸᯧ໘⧚ᯊ ˈᴎᖙ乏⹂ֱ66'व⬉⑤ⱘᣕ㓁կᑨ ϡˈ㛑Ў䖯ܹⳕ⬉݊
ᅗᓣ㗠ߛᮁᇍ66'वⱘ⬉⑤կᑨDŽ�
�
�
�
খ㗗᭛⤂�
>�@�(76,�76����������6PDUW�&DUGV�8,&&���&RQWDFWOHVV�)URQW�HQG��&/)��,QWHUIDFH�3DUW����3K\VLFDO�
DQG�GDWD�OLQN�OD\HU�FKDUDFWHULVWLFV�
>�@�6'�6SHFLILFDWLRQV˖3DUW���PLFUR6'�&DUG�6SHFLILFDWLRQ�9HUVLRQ�����˗$GGHQGXP�WR��6'�
6SHFLILFDWLRQVˈ3DUW���3K\VLFDO�/D\HU�6SHFLILFDWLRQV�
1 3 C o ve r-G N D
1 2 M ic ro S D -G N D
1 1 M ic ro S D -C D
1 0 M ic ro -S D A N T 2
0 9 M ic ro -S D A N T 1
0 8 M ic ro -S D _ D A T 1
0 7 M ic ro -S D _ D A T 0
0 6 M ic ro -S D _ V S S
0 5 M ic ro -S D _ C L K
0 4 M ic ro -S D _ V D D
0 3 M ic ro -S D _ C M D
0 2 M ic ro -S D _ C D /D A T 3
0 1 M ic ro -S D _ D A T 2
P in N O . D e s c rip tio n
P in A s s ig nm e nt
Reel Carton
A 1000 8000
Packing Quality
6 Carton Paper
5 Connector Other
4 Label Paper
3 Reel PS
2 Carrier Tape PS
1 Cover Tape PE
Numbers Name Material
Rev.A Sheet Of 81
GCONN Connector (Shenzhen) Co., Ltd.
PRODUCT SPECIFICATION
Title :
Micro-SD Memory Card Connector.
H = 1.5mm Normal Push Type
Part Number : MSPT10-A0-4000
Spec. No. : P-MSPT10 Revision : A
Revisions Control`
Rev. ECN Number Originator Approval Issue Date
A Initial Release KEN 2008/09/01
Product Specification Origination
Originator: Checked By: Approved By:
PRODUCT SPECIFICATION P-MSPT10
Rev.A Sheet Of 82
Micro-SD Memory Card Connector.
(H = 1.5 mm Normal Push Type)
1. SCOPE
This specification defines the detailed requirements for the Micro-SD Memory Card
Connector. (H = 1.5 mm Normal Push Type)
2. APPLICABLE DOCUMENTS
The following documents form a part of this specification to the extent specified herein.
In the event of conflict between the requirements of this specification and the product
drawing, the product drawing shall take precedence. In the event of conflict between
the requirements of this specification and the referenced documents, this specification
shall take precedence.
2.1 COMMERCIAL STANDARDS AND SPECIFICATION:
IEC-512 Test methods for electrical connectors.
MIL-STD-202/1344 Test methods for electrical connectors.
EIA 364-09 Test methods for electrical connectors.
3. REQUIREMENTS
3.1 DESIGN AND CONSTRUCTION
Product shall be of the design, construction and physical dimensions specified
on the applicable product drawing.
3.2 MATERIALS
A .Housing & Slide & Holder: High temperature thermoplastic, UL94V-0
Housing Color : Black烊Slide Color :Ivory烊Holder Color : Black
B .Terminal & CD Pin烉Copper Alloy.
Finish : (a) Contact Area : Gold plated over Nickel
(b) Solder Tail : Tin plated over Nickel
(c) Under plated : 50ȝ˷Nickel plated over all
C. Lock Pin & Spring & Hook : Stainless
D .Cover: Stainless
Finish : (a) Solder Tail : Gold plated over Nickel
(b) Under plated : 50ȫ˷Nickel plated over all
3.3 RATINGS
Operating Current Rating : 0.5A
Voltage Rating : 5 V
Operating Temperature : -40ɗ to 85ɗ
Storage Temperature : -40ɗ to 85ɗ
Humidity : 95% max. (non condensing)
PRODUCT SPECIFICATION P-MSPT10
Rev.A Sheet Of 83
3.4 TEST REQUIREMENTS AND PROCEDURES SUMMARY
TEST DESCRIPTION REQUIREMENT PROCEDURED
Examination of Product Meets requirements of product Drawing. Visual inspection
No physical damage
ELECTRICAL
Contact resistance Contact Resistance shall not exceed.
Initial:100mȍ Max.
After Test :100mȍ Max.
between adjacent contact to contact.
IEC 512-2-2a,
Open voltage 20mV,Test current 100mA
Insulation resistance Initial: 1000Mȍ Min.
After Test : 100Mȍ Min.
between adjacent contact to contact.
IEC 512-2-3a,
Measure within 1 minute after applying
500VDC.
Dielectric Withstanding
Voltage resistance
500VACrms between adjacent
contact to contact.
IEC 512-2-4a,
(a) No shorting or other damages when
500Vrms AC is applied for 1 minute.
(b) Current leakage 1mA maximum.
MECHANICAL
Insertion/Extraction force Insertion Force : 30N Max.
Extraction Force : 1.0N Min.~30N
Max.
Lock Extraction Force : 1N Min.
Insertion and Extraction at speed of
25 mm/minute. Except influence of the
force for eject and module lock
mechanism.
Static mechanism strength for card
correct insertion
(1) No mechanical damage will
occur on the part .
(2) Be parallel to card insertion
direction.
(1)Force to push the mating card for 20
seconds.
(2) Warranty strength:2Kg force.
Static mechanism strength for card
reversed insertion
(1) No mechanical damage will
occur on the part.
(2) Be parallel to card insertion
direction.
(1)Force to push card by reversed insertion
for 20 seconds.
(2) Warranty strength:2Kg force.
Durability for card reversed insertion (1) No mechanical damage will
occur on the part.
(2) Warranty cycles:40 cycles.
(1)One cycle as defined to parallel to card
insertion direction,to push card to the end.
(2)Reversed insertion of 1Kg force , and
then remove card.
Operating / Non-Operation Random
vibration
(1) No mechanical damage will
occur on parts.
(2) Criteria: Duringtest,signal
discontinuity is never more than
1ȝsec.
Sample quantity烉4+4pcs
1.Oprating烉
3 axes,30 minutes per axes,1.67Grms
Frequency (Hz) A.S.D.(GƳ/Hz)
10~200 0.01
200~500 0.003
Mated connectors shall be subjected
during test.
Sample quantity烉4 pcs
PRODUCT SPECIFICATION P-MSPT10
Rev.A Sheet Of 84
No mechanical damage will occur on
parts.
2.Non-operating烉
3 axes,10 minutes per axes,6.06Grms
Frequency (Hz) A.S.D.(GƳ/Hz)
20 0.0098
80 0.04
350 0.04
2000 0.0069
Sample quantity烉4 pcs
Operating sine vibration (1) No mechanical damage will
occur on parts.
(2)Criteria:Duringtest,signal
discontinuity is never more than
1ȝsec.
Sweep reate:0.5 octave/minute
3 axe,3 sweeps per axis
Frequency (Hz) amplitude
5~9 6.6mm(p-p)
9~200 1.0G
200~500 1.5G
Mated connectors shall be subjected
during test.
(1) No mechanical damage will
occur on parts.
(2)Criteria:Duringtest,signal
discontinuity is never more than
1ȝsec.
Sample quantity烉10+10pcs
1.Oprating烉
(1)mate a card
(2)half-sine wave shock
(3)acceleration烉50G
(4)duration time烉11ms
(5)3 shocks per axis,total 18 shocks
(6) Sample quantity烉10 pcs
Operating / Non-Operation Shock
resistance
No mechanical damage will occur
on parts.
2.Non-operating烉
(1)half-sine wave shock
(2)acceleration烉500G
(3)duration time烉2ms
(4)3 shocks per axis,total 18 shocks
(5) Sample quantity烉10 pcs
Insertion/Extraction durability (1) No physical damage.
(2) Insertion/Extraction
10,000 Cycles.
(3) Check point:1000 cycles
(4) 5 pcs by automation and 5 pcs
by manpower .
EIA 364-09.
Mate and unmated connectors for 500Ʋ50
cycles per hour.
One cycle as defined to insert card into the
socked,and then push to release latch to
extract card
Right Oblique Insertion Resistance No mechanical damage will occur
on parts
(1)Insert the Max./Min. size card along
right deflection,then push to remove
card,10pcs for each size.
(2)20 times for each sample
Left Oblique Insertion Resistance No mechanical damage will occur
on parts
(1)Insert the Max./Min. size card along
left deflection,then push to remove
card,10pcs for each size.
(2)20 times for each sample
PRODUCT SPECIFICATION P-MSPT10
Rev.A Sheet Of 85
Right Oblique Insertion Resistance (1) No mechanical damage will
occur on the part .
(2) Sample quantity烉10+10pcs
1. Insert the maximum size card along
right deflection (tilt 20°) as figure, then
push to remove card. Perform this action
for 100 time for each sample. Totally for
10 samples.
2. Also perform action as above for
minimum size card and totally for 10
samples.
Left Oblique Insertion Resistance (1) No mechanical damage will
occur on the part .
(2) Sample quantity烉10+10pcs
1. Insert the maximum size card along
right deflection (tilt 20°) as figure, then
push to remove card. Perform this action
for 100 time for each sample. Totally for
10 samples.
2. Also perform action as above for
minimum size card and totally for 10
samples.
Static Mechanism Strength for Card
Life Oblique Reversed Insertion
(1) No mechanical damage will
occur on the part .
(2) Sample quantity烉4 pcs
1. Be left oblique to card insertion
direction, force to push the maximum size
card for 20 seconds.
2. Warranty strength : 2 kg force.
Static Mechanism Strength for Card
Right Oblique Reversed Insertion
(1) No mechanical damage will
occur on the part .
(2) Sample quantity烉4 pcs
1. Be right oblique to card insertion
direction, force to push the maximum size
card for 20 seconds.
2. Warranty strength : 2 kg force.
ENVIRONMENTAL
Operating / Non-Operation thermal
shock
(1)No physical damage.
(2)Contact resistance \ Insulation
Resistance shall not exceed Final
value.(mate a card)
Sample quantity烉10+10pcs
Test condition:-40ć/30 minutes to +85ć
30 minutes.
Warranty Cycle:32cycles (1cycle=1hour)
Humidity-Temperature cycling (1)No physical damage .
(2)Contact Resistance\Insulation
Resistance shall not exceed Final
Value.
IEC 512-6-11m
With all kind of cards mated connectors to
10 Cycles (240 hours)
between -10ć and 65ć at 80~98%
relative humidity(1 cycle/day).
Operating / Non-Operation heat
resistance
(1)No physical damage .
(2)Contact Resistance\Insulation
Resistance shall not exceed Finel
Value.
Sample quantity烉4+4pcs
Mated connectors shall be subjected
during test.
Temperature:85ć
Duration:240 hours
Operating / Non-Operation cold
resistance
(1)No physical damage .
(2)Contact Resistance\Insulation
Resistance shall not exceed Final
Value.
Sample quantity烉4+4pcs
Mated connectors shall be subjected
during test.
Temperature:-40ć
Duration:240 hours
Operating / Non-Operation
Temperatureand Humidity
Contact resistance \ Insulation
Resistance shall not exceed Final
value.
Sample quantity烉4+4pcs
Mate connectors shall be subjected during
test.
Steady State 70+/-2ć, 95% RH 240
hours.
PRODUCT SPECIFICATION P-MSPT10
Rev.A Sheet Of 86
Salt spray No harmful corrosion MIL-STD-202F, method101D
Temperature:35 ±2ć ć
Concentration: 5%
Period:48 hours.
H2S Corrosion Resistance No harmful corrosion Temperature:40 ±2ć ć
Gas concentration烉3±1ppm.
Humidity烉75%RH to 80%RH
Duration times烉24 hours
PHYSICAL
Solderability Solder Tail shall be covered more
than 95% of immersed area with
flash solder.
MIL-STD-202F, method 208
Solder temperature : 245 ±5ć ć
Period : 5±0.5sec.
MIL-STD-202F,method 208
Resistance to Reflow Soldering Heat No physical damage shall occur. Pre Heat烉160~190 , ć 60~120sec.
Reflow time: above 220 Min,30~90sec.
Peak Temp.烉250+0/-5 , ć 5~10sec.
Duration烉2 cycles(see figure3)
Figure 1
PRODUCT SPECIFICATION P-MSPT10
Rev.A Sheet Of 87
3.5 PRODUCT QUALIFICATION AND REQUALIFICATION TEST SEQUENCE
Test or
Examination Test Group
Test Sequence (a)
A B C D E F G H I J K L M N O P Q R S T
Resistance to Reflow Soldering Heat 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
Examination of Product 2 2,6 2,6 2,6 2,6 2,6 2,6 2,8 2,8 2,10 2,6 2,6 2,10 2,6 1,3 2,6 2,6 2,6 2,6 2,6
Contact Resistance 3,5 3,5 3,5 3,5 3,5 3,5 3,7 3,7 3,9 3,5 3,5 3,9 3,5 3,5 3,5 3,5 3,5 3,5
Insulation Resistance 4,6 4,8 4,8
Dielectric Withstanding
Voltage Resistance 5,7 5,7
Insertion and pulling force 3 4,6
Static mechanism strength
for card correct insertion 4
Static mechanism strength
for card reversed insertion 4
Durability for card reversed insertion 4
Operating / Non-Operation Random
vibration 4
Operating sine vibration 4
Operating / Non-Operation Shock
resistance 4
Insertion/Extraction durability 5
Operating / Non-Operation thermal
shock 5
Humidity-Temperature cycling 6
Operating / Non-Operation heat
resistance 4
Operating / Non-Operation cold
resistance 4
Operating / Non-Operation
Temperatureand Humidity 6
Salt spray 4
Solderability 2
H2S Corrosion Resistance 4
Right Oblique Insertion Resistance 4
Left Oblique Insertion Resistance 4
Static Mechanism Strength for Card
Life Oblique Reversed Insertion 4
Static Mechanism Strength for Card
Right Oblique Reversed Insertion 4
Sample Quantity(pcs) 4 4 4 10 8 4 20 10 20 4 8 8 8 4 4 4 20 20 4 4
Figure 2
NOTE:(a) The numbers indicate sequence in which tests were performed .
(b) The test samples were randomly selected from normal current production lots .
(c) The test Group “O” doesn’t have to be test in IR reflow .
3.5 RECOMMENDED IR REFLOW CONDITION
PRODUCT SPECIFICATION P-MSPT10
Rev.A Sheet Of 88
Figure 3 .Temperature Condition graph (Lead free)
Rev. A Sheet Of 101
GCONN Connector (Shenzhen) Co., Ltd.
TEST REPORT
Title :
Micro-SD Memory Card Connector
H=1.5mm Normal Push Type
Part Number : MSPT10-A0-4000
Spec. No. : T-MSPT10 Revision : A
Revisions Control
Rev. ECN Number Originator Approval Issue Date
A Initial Release KEN 2008/11/10
Test Report Origination
Originator: Checked By: Approved By:
TEST REPORT T-MSPT10
Rev.A Sheet Of 10 2
Micro SD Memory Card Connector
(H=1.5mm Normal Push Type)
1. INTRODUCTION
1.1. Purpose
The primary purpose of the test was performed on the Micro-SD Memory Card Connector
(H=1.5mm Normal Push Type)to determine its conformance to the requirements of project
specification.
1.2. Scope
This report includes the electrical, mechanical, and environmental performance of Micro-SD
Memory Card Connector (H=1.5mm Normal Push Type).
1.3. Conclusion
Micro-SD Memory Card Connector (H=1.5mm Normal Push Type) meets the electrical,
mechanical, and environmental performance requirements of product specification.
1.4. Product Description
The Micro-SD Memory Card Connector (H=1.5mm Normal Push Type)applied at
printed circuit board.
The contacts are made from copper alloy with gold plating on the contact interface and
Tin only plating on the soldertail , Nickel under plating over all.
The housing material is UL94V-0 High Temperature Thermoplastic insulating polymer.
1.5. Test Samples
The test sample following Project Specification sequence in which tests were performed.
Test Group Quantity Part Number Description
A,B,C,D,E,F,G,H,I,J,K,L,M,N ,O follow Spec MSPT10-A0-4000 Micro-SD Memory Card Connector
P,Q,R,S,T,U,V (H=1.5mm Normal Push Type)
DR DATE
APVD DATE
TEST REPORT T-MSPT10
Rev.A Sheet Of 10 3
1.6. Qualification Test Sequence
Test Group
A B C D E F G H I J K L M N O P Q R S T U VTest or Examination
Test Sequence(a)
Resistance to Reflow
Physical Surface Heat 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
Examination of
Product 2 2,6 2,6 2,6 2,6 2,6 2,6 2,8 2,8 2,10 2,6 2,6 2,10 2,6 1,3 2,8 2,8 2,6 2,6 2,6 2,6 2,6
Contact Resistance 3,5 3,5 3,5 3,5 3,5 3,5 3,7 3,7 3,9 3,5 3,5 3,9 3,5 3,7 3,7 3,5 3,5 3,5 3,5 3,5
Insulation Resistance 4,6 4,8 4,8
DWV 5,7 5,7
Extraction and
Insertion Force 3 4,6 4,6 4,6
Static mechanism
strength for card
Correct insertion
4
Static mechanism
strength for card
Reversed insertion
4
Durability for card
reversed insertion 4
Operating Random
Vibration 4
Operating Sine
Vibration 4
Operating Shock
Resistance 4
Insertion/Extraction
Durability Cycle 5
Operation Thermal
Shock 5
Humidity-Temperature
cycling 6
Operating heat
resistance 4
Operating cold
resistance 4
Humidity 6
Salt Spray 4
Solderability
本文档为【中國銀聯智能SD卡座規範】,请使用软件OFFICE或WPS软件打开。作品中的文字与图均可以修改和编辑,
图片更改请在作品中右键图片并更换,文字修改请直接点击文字进行修改,也可以新增和删除文档中的内容。
该文档来自用户分享,如有侵权行为请发邮件ishare@vip.sina.com联系网站客服,我们会及时删除。
[版权声明] 本站所有资料为用户分享产生,若发现您的权利被侵害,请联系客服邮件isharekefu@iask.cn,我们尽快处理。
本作品所展示的图片、画像、字体、音乐的版权可能需版权方额外授权,请谨慎使用。
网站提供的党政主题相关内容(国旗、国徽、党徽..)目的在于配合国家政策宣传,仅限个人学习分享使用,禁止用于任何广告和商用目的。